OTF STUDIO:  THIN FILM SOFTWARE FOR ANY CHALLENGE

New features, updates, and bug fix are here.


The most recent version 25.45:

  • New option to process XY scan measurement data (batch processing) and to visualize the results as contour maps.
  • New operations with measurements 
  • Settings through sliding panel and tooltips in Fitting panel
  • Color stripes in monitoring spread sheet

This article is coming soon

Mauer1

 

Michael Trubetskov is winner of all recent optical interference coatings design contests

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